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In the cable accessories, the charge injection and dredging ability of different semi-conductive shielding layers is different, which will directly affect the accumulation of charge inside the insulation layer. In order to explore the differences in charge injection and dredgeability of different semi-conductive materials, and reflect the electrical and insulation properties of different semi-conductive materials as cable accessories, three semi-conductive materials ethylene-vinyl acetate copolymers (EVA) were carried out in the laboratory under direct current electric field. Effect of silicone rubber (SR) and ethylene-propylene-diene monomer (EPDM) rubber on charge accumulation characteristics in crosslinked polyethylene (XLPE) slices. The results show that the charge dissipation ability of different base materials is different. The charge dissipation capacity of SR semi-conductive materials is weaker than that of EVA copolymer semi-conductive and EPDM semi-conductive, because the different molecular structures of the two interface materials determine the contact barrier. The larger the contact barrier, the harder the charge is to dissipate.

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Study on the Mechanism of Insulation Degradation Induced by Space Charge Accumulation Under DC High Field Intensity

  • 会议论文

  • 发表日期：

    2025年

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  • Lin Cheng,
  • Kun Zuo,
  • Jihou He,
  • Dongxin He

摘要

In the cable accessories, the charge injection and dredging ability of different semi-conductive shielding layers is different, which will directly affect the accumulation of charge inside the insulation layer. In order to explore the differences in charge injection and dredgeability of different semi-conductive materials, and reflect the electrical and insulation properties of different semi-conductive materials as cable accessories, three semi-conductive materials ethylene-vinyl acetate copolymers (EVA) were carried out in the laboratory under direct current electric field. Effect of silicone rubber (SR) and ethylene-propylene-diene monomer (EPDM) rubber on charge accumulation characteristics in crosslinked polyethylene (XLPE) slices. The results show that the charge dissipation ability of different base materials is different. The charge dissipation capacity of SR semi-conductive materials is weaker than that of EVA copolymer semi-conductive and EPDM semi-conductive, because the different molecular structures of the two interface materials determine the contact barrier. The larger the contact barrier, the harder the charge is to dissipate.