Backscattered electron (BSE) imaging is a scanning electron microscopy (SEM) technique used to analyze the composition and microstructure of materials, including cement and concrete. BSE utilizes the electrons that are scattered back after interacting with the sample surface to generate high-resolution images. The intensity of the backscattered electrons depends on the atomic number of the elements in the sample; thus, BSE provides compositional contrast between different phases within the cement matrix and can reveal details about the hydration products, porosity, and the presence of microcracks.