Topographical and Magnetic Investigations of Pulse-Electrodeposited Co/Cu Multilayer Structure
摘要
Composition modulation of copper/cobalt (Cu) multilayer (two-dimensional nanostructure) has been deposited by using wet chemical method (electroplating technique). Low-angle X-ray diffraction (LAXRD) and depth profiling X-ray photoelectron spectroscopy (XPS) techniques used to investigate multilayer structure. The optimization of the pulse frequency utilized in pulse electrodeposition has been empirically demonstrated to facilitate the development of a copper/cobalt multilayer phase. The formation of a coherent multilayer, showcasing antiphase oscillations within the Cu/Co compositional profile, has been substantiated. Anti-ferromagnetic coupling among the layers of the multilayer film have been confirmed by magnetic force microscopy (MFM) and magnetization measurement studies.