Response of materials to the external field such as electric field, magnetic field, and mechanical force is a major concern in materials science. In-situ time-resolved X-ray diffraction (XRD) technique provides information on dynamic structural change by such external fields. In this chapter, we first introduce the basic pump and probe methods and then describe the experimental setup, data acquisition and analysis for the case of piezoelectric response of ferroelectric thin films by application of short voltage pulses at synchrotron facility.