Dielectric Investigations of Al–doped M–type Strontium Hexaferrite (SrFe11.0Al1.0O19)
摘要
A dielectric study of Al-substituted strontium hexaferrite nanoparticles (SrAlFe11O19) has been performed. The phase formation of the sample was confirmed via X-ray diffraction (XRD) and the surface morphology through scanning electron microscopy (SEM). The system belonged to the P63/mmc space group and had magneto plumbite crystal structure. The lattice parameters a and c were determined as 5.85 and 21.98 Å, respectively. Dielectric studies revealed that dielectric constant rapidly decreases with rise in frequency and increases with rise in temperature. The relaxations and polarisation effects in the material were exposed by the dielectric investigations. Electrical properties and variation of impedance with frequency of the material are also discussed.