C-GIS (Cubical Gas Insulated Switchgear) is a crucial component in the renewable energy sector. However, the increased deployment of renewable energy sources has exacerbated the issue of overheating at T- type cable terminals, which can lead to damage to C-GIS and negatively impact power supply stability, resulting in economic losses for the power grid. Currently, research on cable terminal thermal faults primarily focuses on insulation interface creepage, temperature monitoring, and improvements in on-site acceptance testing. There is a lack of in-depth analysis on the causes of thermal failures at T- type cable terminals, and the key influencing factors behind these thermal faults have not been clearly identified. To reveal the influence of crimped terminals on the overheating faults of T- type cable terminals, this paper proposes a simplified equivalent modeling method for crimped terminals and uses this method to construct a finite element model of the T- type cable terminals. Finally, by varying the contact coefficient, a simulation analysis was performed to study the impact of contact resistance at the crimped joint on the temperature variation of T- type cable terminals. This provides a simulation basis for analyzing and designing solutions for thermal faults in T- type cable terminals.

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Study on the Influence of Contact Resistance on the Thermal Field Distribution of T- type Cable Terminals

  • Jidong Wang,
  • Rong Si,
  • Huiqi Wang,
  • Ning Zhou,
  • Cong Dai,
  • Zhizi Zheng

摘要

C-GIS (Cubical Gas Insulated Switchgear) is a crucial component in the renewable energy sector. However, the increased deployment of renewable energy sources has exacerbated the issue of overheating at T- type cable terminals, which can lead to damage to C-GIS and negatively impact power supply stability, resulting in economic losses for the power grid. Currently, research on cable terminal thermal faults primarily focuses on insulation interface creepage, temperature monitoring, and improvements in on-site acceptance testing. There is a lack of in-depth analysis on the causes of thermal failures at T- type cable terminals, and the key influencing factors behind these thermal faults have not been clearly identified. To reveal the influence of crimped terminals on the overheating faults of T- type cable terminals, this paper proposes a simplified equivalent modeling method for crimped terminals and uses this method to construct a finite element model of the T- type cable terminals. Finally, by varying the contact coefficient, a simulation analysis was performed to study the impact of contact resistance at the crimped joint on the temperature variation of T- type cable terminals. This provides a simulation basis for analyzing and designing solutions for thermal faults in T- type cable terminals.