Conducted EMI Analysis of Buck Converter Based on Field-Circuit Co-simulation
摘要
High-speed switching of semiconductor devices generates significant electromagnetic noise and leads to serious electromagnetic compatibility (EMC) issues. This paper establishes a field-circuit co-simulation model to analyzes conducted EMI issues specific to Buck converters and compares the effectiveness with the result of circuit simulation model. The results indicate that the field-circuit co-simulation offers substantial advantages in analyzing high-frequency conducted interference in Buck converters, as it captures more parasitic effects and high-frequency noise caused by electromagnetic coupling. Furthermore, the influence of the switching frequency on conducted EMI was analyzed based on the field-circuit co-simulation model. The results show that within the switching frequency range of 400 kHz to 600 kHz, for every increase of 100 kHz in switching frequency, the frequency bandwidth increases by approximately 6 MHz and the peak value of the conducted interference signal increases by about 5 \(dB\mu V\) under stable conditions.