Enhancing Design for Testability and Optimizing Time to Market for Soft IPs
摘要
In this article, a method to achieve good scan coverage in the early stages of the design flow, with the overarching goals of reducing ‘time to market’ and the cost of the design process has been discussed. In today’s fast-paced electronics industry, getting products to market quickly and cost-effectively is paramount. Achieving comprehensive scan coverage at an early stage is critical for meeting these objectives. In the process, the design will also be verified not only for scan coverage but also for design readability issues and potential debugging strategies. These goals are achieved through the seamless integration of design tools provided by Synopsys and Siemens. These industry-leading tools empower designers to tackle the complexities of testing intricate digital systems with greater efficiency, precision, and effectiveness. Firstly, it helps to ensure that the designed systems are thoroughly testable which enhance overall product quality and reliability. Secondly, it substantially reduces the overall test time, which is crucial for meeting tight project timelines. Finally, it results in cost saving which makes the entire design process more economically viable.