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To address the traceability of voltage-ratio standard devices, we propose and experimentally validate a differential-sampling technique that exploits quantum voltage references to obtain high-accuracy measurements of voltages on both the primary and secondary sides of a ratio device. The work focuses on the design and implementation of the critical elements of the differential-sampling scheme and the development of a dedicated differential-sampling instrument. The instrument performs three primary functions: (1) detection of Josephson quantum-step switching events, (2) precise timing control of sampling pulses synchronized to the step transitions, and (3) numerical reconstruction of differential acquisition data recorded by a high-precision digital multimeter (DMM). Reconstructed differential data are formatted and transmitted to the host computer using the standardized 9–2 message protocol to facilitate downstream processing and archival. An experimental platform was constructed to verify the feasibility and performance of the differential-sampling approach. The platform generates a 50 Hz AC test signal with a nominal amplitude of 6 V. A RIGOL DG822 Pro signal generator was employed to emulate the AC quantum voltage source and the device-under-test output; a Keysight 3458A DMM served as the precision acquisition instrument. DC voltage sampling was implemented using an integration (averaging) method, taking advantage of the 3458A’s high-resolution DCV capability; the system achieves an effective resolution up to eight-and-a-half digits under the applied conditions. Experimental results demonstrate that the proposed differential-sampling system attains an amplitude measurement error of 0.1% for the tested 50 Hz, 6 V signal. These results validate the practical viability of the method for establishing traceability of voltage-ratio standards and indicate that the system can reliably identify quantum-step transitions, control sampling timing, and reconstruct differential voltage measurements with metrological-grade performance.

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Research and Experimental Verification of a Differential Sampling Device Based on Quantum Voltage

  • 会议论文

  • 发表日期：

    2026年

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  • Qiuyu Xu,
  • Ming Ding,
  • Dong Li,
  • Qi Nie

摘要

To address the traceability of voltage-ratio standard devices, we propose and experimentally validate a differential-sampling technique that exploits quantum voltage references to obtain high-accuracy measurements of voltages on both the primary and secondary sides of a ratio device. The work focuses on the design and implementation of the critical elements of the differential-sampling scheme and the development of a dedicated differential-sampling instrument. The instrument performs three primary functions: (1) detection of Josephson quantum-step switching events, (2) precise timing control of sampling pulses synchronized to the step transitions, and (3) numerical reconstruction of differential acquisition data recorded by a high-precision digital multimeter (DMM). Reconstructed differential data are formatted and transmitted to the host computer using the standardized 9–2 message protocol to facilitate downstream processing and archival. An experimental platform was constructed to verify the feasibility and performance of the differential-sampling approach. The platform generates a 50 Hz AC test signal with a nominal amplitude of 6 V. A RIGOL DG822 Pro signal generator was employed to emulate the AC quantum voltage source and the device-under-test output; a Keysight 3458A DMM served as the precision acquisition instrument. DC voltage sampling was implemented using an integration (averaging) method, taking advantage of the 3458A’s high-resolution DCV capability; the system achieves an effective resolution up to eight-and-a-half digits under the applied conditions. Experimental results demonstrate that the proposed differential-sampling system attains an amplitude measurement error of 0.1% for the tested 50 Hz, 6 V signal. These results validate the practical viability of the method for establishing traceability of voltage-ratio standards and indicate that the system can reliably identify quantum-step transitions, control sampling timing, and reconstruct differential voltage measurements with metrological-grade performance.