Tip-enhanced Raman for Nanoscale Thermal Probing
摘要
Accurate temperature measurement at nanometer scales is critical for understanding localized energy dissipation, yet remains difficult due to limited spatial resolution and the complexity of heat transport at small dimensions. Section 7.1 outlines the fundamental challenges in nanoscale temperature measurement. Section 7.2 provides an overview of existing nanoscale thermal probing techniques, including scanning thermal microscopy. Section 7.3 introduces the principles and instrumentation of tip-enhanced Raman spectroscopy. Section 7.4 focuses on the development of tip-enhanced Raman thermometry (TERT), which combines the spatial precision of TERS with the temperature sensitivity of Raman thermometry to achieve localized thermal measurements with sub-10 nm spatial resolution. Finally, Sect. 7.5 discusses ballistic thermal transport probed by TERT, providing new insights into non-diffusive phonon dynamics in semiconductors.