This paper presents a systematic review of charge pump technology applications in physical destruction circuits for secure data eradication. With the ubiquitous integration of electronic devices in modern society, secure circuit destruction has emerged as a critical concern within information security domains. As the core component of boost circuits in physical destruction systems, charge pumps enable efficient voltage conversion from low to high levels sufficient for permanent storage media damage. Recent advancements in charge pump technology have demonstrated notable progress in four key areas: circuit topology innovation, energy efficiency optimization, dynamic performance enhancement, and low-power design methodologies. However, persistent challenges including high-frequency switching losses and parasitic-induced energy dissipation continue to constrain full potential realization. Through comprehensive analysis of historical developments and contemporary breakthroughs, this review critically evaluates current technological capabilities, identifies limitations in existing approaches, and proposes promising research directions for performance improvement and practical implementation optimization.