Gaussian Process Bayesian Regression and PCA Framework for Reliability Evaluation of H₂S Gas Sensors Based on WO₃/RGO Nanocomposites
摘要
Semiconductor metal oxide (MOS) gas sensors employing metal oxide semiconductor materials such as WO₃, SnO₂, ZnO, TiO₂, and V₂O₅… are widely used to detect the presence of hazardous gases in the environment, including NO₂, NH₃, and H₂S. This paper proposes the development of an integrated framework combining statistical learning and Bayesian inference through Gaussian Process Regression (GPR) to optimize and assess the reliability of H₂S sensors fabricated from WO₃/rGO nanocomposites. Time-resolved resistance data were collected from five sensor samples under various operating temperatures (200–450 ℃) and H₂S concentrations (1–20 ppm). After preprocessing and feature extraction, techniques such as Principal Component Analysis (PCA), Naive Bayes classification, and GPR were applied to identify the optimal sensor samples and predict gas concentrations. The results demonstrate that GPR achieves a low prediction error (RMSE < 1.5 ppm) while simultaneously providing probabilistic confidence intervals that reflect predictive uncertainty. This study highlights the potential of integrating nano-scale sensing materials with advanced statistical learning approaches for the development of intelligent and robust gas sensing systems.