Automatic Aging Prediction of High Voltage Apparatus Based on Differential Measurements
摘要
Predicting the aging state of high-voltage electrical equipment is critical to preventing failures that may result in safety hazards and substantial economic losses. This work introduces a differential measurement approach that mitigates system-specific bias, thereby improving the generalization of machine learning models to new apparatuses. Experimental validation on real-world data shows a 38% reduction in mean absolute error on unseen test cases, highlighting the practical value of the method.