It is commonly known that in smart cities, light-emitting diodes will always take the place of compact fluorescent and incandescent lighting. However, one important aspect that needs to be addressed in the context of light emitting diodes and dimming is, degradation of correlated colour temperature (CCT). Dimming will alter the temperature at the junction and T-point. Thus, any changes in light intensity will finally bring changes in the temperature. Subsequently with changes in T-point temperature CCT also changes. The degradation of CCT will implicate the quality and quantity of light delivered by LED. In LEDs apart from ambient temperature Test point or commonly referred as T-point temperature also plays a vital role as it depicts the solder point temperature of the device. In this paper an attempt has been made to work out a relation between the T-point temperature and CCT. This relation will provide sufficient insight to the manufacturers. 000-3-2 are rarely included in the AC-DC driver circuit of the LEDs that are currently on the market. In addition to improving the current that the gadget draws, this is crucial for preserving the energy efficiency of the closest utility services. The work that follows anticipates these problems and suggests a corrective driver circuit based on two distinct driver topologies: flyback topology and buck-boost topology. The purpose of both of these topologies is to address the issues of power quality and how it affects the device's lifespan.