This chapter presents the NeuroBreakoutBoard (NBB), an instrumentation platform for evaluating memristive devices, crossbars, and operations. The NBB integrates custom signal generation, routing, and sensing circuitry with flexible interfaces for both device-level characterization and computing-in-memory (CIM) experiments. Hardware modules include multi-range DACs, fast pulse generators, load drivers, multiplexed interconnection matrices, and high-resolution transimpedance amplifiers connected to parallel ADCs. Two interfaces enable integration of crossbar chips and controller units. A modular firmware stack orchestrates hardware modules through protocol buffer communication, while host-side application interfaces provide device, crossbar, and operation-level abstractions. A case study demonstrates the use of the NBB to assess the reliability of a fabricated 1T1R ReRAM crossbar. Results include manufacturing yield analysis, binary and multi-level programming, endurance behavior, and CIM execution in both analog and logic-in-memory modes. Limitations of array size, current handling, and communication speed are discussed, alongside proposed improvements such as FPGA integration and enhanced logic-gate support.

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Instrumentation Platform for Non-Volatile Memory Technologies

  • Felix Staudigl,
  • Rainer Leupers

摘要

This chapter presents the NeuroBreakoutBoard (NBB), an instrumentation platform for evaluating memristive devices, crossbars, and operations. The NBB integrates custom signal generation, routing, and sensing circuitry with flexible interfaces for both device-level characterization and computing-in-memory (CIM) experiments. Hardware modules include multi-range DACs, fast pulse generators, load drivers, multiplexed interconnection matrices, and high-resolution transimpedance amplifiers connected to parallel ADCs. Two interfaces enable integration of crossbar chips and controller units. A modular firmware stack orchestrates hardware modules through protocol buffer communication, while host-side application interfaces provide device, crossbar, and operation-level abstractions. A case study demonstrates the use of the NBB to assess the reliability of a fabricated 1T1R ReRAM crossbar. Results include manufacturing yield analysis, binary and multi-level programming, endurance behavior, and CIM execution in both analog and logic-in-memory modes. Limitations of array size, current handling, and communication speed are discussed, alongside proposed improvements such as FPGA integration and enhanced logic-gate support.