Scholarlink

The integration of FPGAs into security-critical systems entails a thorough evaluation of their vulnerability to fault injection attacks. ElectroMagnetic Fault Injection (EMFI) represents a particularly concerning threat vector due to its non-invasive characteristics, affordability, and capacity for precisely inducing transient faults. Our research examines the susceptibility to single EM pulsed attacks of Ring Oscillators (ROs), which can serve as a building block for both security primitives and EMFI sensors. By conducting different experiments on 28 nm Xilinx FPGAs, we reveal that RO harmonic responses significantly vary based on the spatial configuration and routing constraints of the ring within the FPGA die. Additionally, we demonstrate the paramount importance of evaluating the EM pulse polarity and injection timing effects as they critically influence the fault distribution pattern while enabling a full control over the induced harmonic errors. These findings underscore the critical role of the FPGA resource utilization in security, providing valuable insights for the design of effective EMFI countermeasures and robust RO-based hardware implementations.

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Challenges in FPGA Resource Allocation and Placement for Efficient EM Fault Attack Detection Strategies

  • 会议论文

  • 发表日期：

    2026年

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  • Sami El Amraoui,
  • Régis Leveugle,
  • Paolo Maistri

摘要

The integration of FPGAs into security-critical systems entails a thorough evaluation of their vulnerability to fault injection attacks. ElectroMagnetic Fault Injection (EMFI) represents a particularly concerning threat vector due to its non-invasive characteristics, affordability, and capacity for precisely inducing transient faults. Our research examines the susceptibility to single EM pulsed attacks of Ring Oscillators (ROs), which can serve as a building block for both security primitives and EMFI sensors. By conducting different experiments on 28 nm Xilinx FPGAs, we reveal that RO harmonic responses significantly vary based on the spatial configuration and routing constraints of the ring within the FPGA die. Additionally, we demonstrate the paramount importance of evaluating the EM pulse polarity and injection timing effects as they critically influence the fault distribution pattern while enabling a full control over the induced harmonic errors. These findings underscore the critical role of the FPGA resource utilization in security, providing valuable insights for the design of effective EMFI countermeasures and robust RO-based hardware implementations.