Investigation of EM Fault Injection on Emerging Lightweight Neural Network Hardware
摘要
This study investigates electromagnetic fault injection (EMFI) on lightweight neural networks hardware. Three compact neural networks (MobileNet, ResNet, EfficientNet) were trained first on Fashion-MNIST and later with CIFAR-10 datasets, then implemented on a custom NVM-based lightweight tinyML hardware platform for EMFI susceptibility testing. We demonstrate that the stored model weights on NVM, can be corrupted by EM injection on the NVM chip during network loading. Further, we demonstrate that the EMFI corrupted weights can lead upto 40% reduction in inference accuracy in case of highly sensitive lightweight models.