In this paper, the elemental profile of the titanium dioxide nanoparticles treated garlic plant has been analysed by synchrotron radiation induced X-ray fluorescence spectroscopy (SRXRF). For this, garlic plants have been grown in the laboratory under controlled conditions of light flux, temperature, humidity, and nutrient media. The SRXRF spectra of the control and titanium dioxide nanoparticles-treated garlic plants have been acquired. The measurements have been taken for the qualitative and quantitative determination of the elements profile in the plant. The spectral signature for the different element observed in the energy range of 2–9 keV. The recorded spectrum shows presence of several Kα and Kβ X-ray lines of phosphorus, sulphur, chlorine, potassium, calcium, iron, titanium, manganese, nickel, copper and zinc elements in the leaf of garlic. The elemental profile of the leaf of the control and titanium dioxide nanoparticles treated garlic plants observed from the fluorescence spectrum shows increase in the concentration of the elements due to the treatment of titanium dioxide nanoparticles. Principal component analysis (PCA) has been performed for the data obtained from the SRXRF spectra of control and titanium dioxide nanoparticles treated garlic seedlings for distinguishing the variation in the sample due to the treatments. Treatment of the garlic plants with the titanium dioxide nanoparticles displays its positive impact on the growth and development of the plants. The data obtained from the present study shows that the mineral profile of the garlic plants are stimulated by the treatment of titanium dioxide nanoparticles indicating its applicability as promising supplements in the near future for enhancing the plant production.