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Secondary ion mass spectrometry is a versatile, unique, state of the art technique for in-situ, nano-micro scale isotopic analysis of solid samples with sub-permil level high analytical precision. These unique mass spectrometry features hallmarked with the real time ion microscope capability of almost the entire periodic table elements and their isotopes lends it unique advantages for studies in various disciplines of sciences, engineering, and humanities. The optimal functioning and analysis of the state of art SIMS technique is guaranteed within a narrow range of thermo-electrical condition which constitute its limitation. The basic principle, functioning, and caveats of the analytical procedures are discussed through some typical applications in cosmochemistry and Earth science.

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In Situ, Microscopic, Microanalytical View of the Solar System Using Secondary Ion Mass Spectrometer

  • 章节

  • 发表日期：

    2025年

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  • Ritesh Kumar Mishra,
  • Kuljeet Kaur Marhas

摘要

Secondary ion mass spectrometry is a versatile, unique, state of the art technique for in-situ, nano-micro scale isotopic analysis of solid samples with sub-permil level high analytical precision. These unique mass spectrometry features hallmarked with the real time ion microscope capability of almost the entire periodic table elements and their isotopes lends it unique advantages for studies in various disciplines of sciences, engineering, and humanities. The optimal functioning and analysis of the state of art SIMS technique is guaranteed within a narrow range of thermo-electrical condition which constitute its limitation. The basic principle, functioning, and caveats of the analytical procedures are discussed through some typical applications in cosmochemistry and Earth science.