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An optoelectronic coherent microscope (O.E.C.M.) referred to as confocal scanning laser microscopy (CSLM) in this chapter to study aberrations. The two microscope objectives are arranged in tandem, as shown in Fig. 8.1. This microscope (CSLM) uses a focused laser beam where the object found in the back focal plane of the first objective lens \({\text{P}}_{1}\) is mechanically scanned in the spatial plane defined by z = constant.

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Aberration Studies Using a Confocal Scanning Laser Microscope

  • 章节

  • 发表日期：

    2025年

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  • Abdallah Mohamed Hamed

摘要

An optoelectronic coherent microscope (O.E.C.M.) referred to as confocal scanning laser microscopy (CSLM) in this chapter to study aberrations. The two microscope objectives are arranged in tandem, as shown in Fig. 8.1. This microscope (CSLM) uses a focused laser beam where the object found in the back focal plane of the first objective lens \({\text{P}}_{1}\) is mechanically scanned in the spatial plane defined by z = constant.