Spectroscopy is used to refer to the measurement of transmitted/reflected radiation intensity as a function of wavelength. The intensity of light transmitted/reflected by snow layers depends on local optical parameters of snow such as extinction coefficient, absorption coefficient, and directional light scattering coefficient (phase function). In turn these local optical parameters depend on the snow microstructure and pollution load. Therefore, several important snow parameters can be derived from snow spectral reflectance and transmittance measurements. In some cases the spectral polarization parameters are measured. Usually, the snow reflectance spectroscopy is used due to much easier experimental setup as compared to the snow transmittance/internal light filed measurements. However, diffuse light transmittance measurements enhance the information content and, therefore, provide additional information for the solution of inverse problems of snow optics. Therefore, we consider the techniques for the determination of snow properties based on both reflectance and transmittance measurements.