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A unique strength of TEM is its ability to obtain crystallographic data from specific locations in electron-transparent specimens. As described in W&C, Chaps. 16 – 21 , we can accomplish this via several techniques: selected-area diffraction (SAD) (sometimes abbreviated to SAED) patterns, Kikuchi patterns, convergent-beam electron diffraction (CBED) and microdiffraction.

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Electron Diffraction and Phase Identification

  • 章节

  • 发表日期：

    2026年

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  • M. Grace Burke

摘要

A unique strength of TEM is its ability to obtain crystallographic data from specific locations in electron-transparent specimens. As described in W&C, Chaps. 16 – 21 , we can accomplish this via several techniques: selected-area diffraction (SAD) (sometimes abbreviated to SAED) patterns, Kikuchi patterns, convergent-beam electron diffraction (CBED) and microdiffraction.