The aging of photovoltaic (PV) modules is an undeniable phenomenon that impacts their performance over time. This aging process is influenced by various environmental parameters, including temperature, wind, snow, humidity, and prolonged exposure to ultraviolet (UV) irradiation. Understanding the mechanisms behind PV module aging is a crucial step toward implementing effective mitigation strategies. This paper focuses on investigating the impact of mechanical stress on crystalline silicon (c-Si) PV modules, simulating the effects of cracks and inactive areas on electrical parameters. In pursuit of this objective, the study conducts statistical mechanical load tests to replicate the aging process. The research highlights the consequences of artificially introducing cracks into PV modules, utilizing an array of advanced tools such as a mechanical load tester, electroluminescence imaging, and a solar flasher. To ensure the accuracy and reliability of the findings, the study incorporates verification routines using an electroluminescence (EL) machine and a solar simulator before and after the mechanical load tests. The study involves two commercial PV modules subjected to varying degrees of mechanical stress severity. The results reveal that mechanical stress can lead to a power output degradation of up to 0.58%. By shedding light on the mechanical aspects of degradation, this research contributes to the collective understanding of PV module aging, providing insights that form the basis for the development of strategies aimed at improving the durability and efficiency of PV systems.