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This chapter focuses on circuit-level techniques, completing the analysis of radiation hardening by design (RHBD) methods across various design abstraction levels. Here, we evaluate the charge sharing effect, considering its dependence on cell placement and logic synthesis. Subsequently, an optimization methodology is proposed to enhance overall circuit hardness through signal probability–based pin swapping.

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Analysis of Circuit-Based RHBD Techniques

  • 章节

  • 出版模式：

    开放获取

  • 发表日期：

    2025年

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  • Ygor Quadros de Aguiar,
  • Frédéric Wrobel,
  • Jean-Luc Autran,
  • Rubén García Alía

摘要

This chapter focuses on circuit-level techniques, completing the analysis of radiation hardening by design (RHBD) methods across various design abstraction levels. Here, we evaluate the charge sharing effect, considering its dependence on cell placement and logic synthesis. Subsequently, an optimization methodology is proposed to enhance overall circuit hardness through signal probability–based pin swapping.