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Embedded devices hold secrets that are, unsurprisingly, coveted, and many malicious attackers are preparing to extract them illegitimately. Typical attacks involve measuring the device’s power consumption or radiated electromagnetic (EM) field. These measurements are noisy sources of information that are, in one way or another, correlated with secrets. Consequently, analyzing these leaks enables us to recover the secrets.

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Introduction

  • 章节

  • 发表日期：

    2025年

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  • Wei Cheng,
  • Sylvain Guilley,
  • Olivier Rioul

摘要

Embedded devices hold secrets that are, unsurprisingly, coveted, and many malicious attackers are preparing to extract them illegitimately. Typical attacks involve measuring the device’s power consumption or radiated electromagnetic (EM) field. These measurements are noisy sources of information that are, in one way or another, correlated with secrets. Consequently, analyzing these leaks enables us to recover the secrets.