Towards Testing in Integrated Photonics
摘要
Integrated photonics is becoming pervasive, and it is penetrating many different fields, from typical Optical Communications to the novel Artificial Intelligence and Machine Learning areas. Even though Photonic Integrated Circuits (PICs) are being widespread, their diffusion is being limited by a lack of standardizations, which spans from design activity to the testing. Concerning the latter, this chapter states the main challenges of photonic testing and summarizes the proposed solutions.