Abstract <p>In the previous article (Part 1), the basic principles and international experience (according to CIGRE) of the development, calculation, and testing of the short-circuit resistance of large-scale models of powerful single-phase power transformers, as well as the rules for distributing test results of the model of a real transformer in order to confirm its resistance to short circuits, are considered. The importance of developing and testing such models to substantiate the reliability of domestically produced high-power transformers is noted. The article provides more detailed calculations of one of the 570-MVA transformer layouts described in the previous article. The results of the preliminary design of the two most commonly used transformers in the Russian Federation, with a capacity of 630 and 417 MVA, and their corresponding layouts based on calculations of resistance to short circuits using the REST-VEI method are also considered.</p>

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Testing of Models of Powerful Power Transformers to Check Their Resistance to Short Circuits. Part 2. Examples of Models of Block Transformers

  • D. K. Adzhiev,
  • V. S. Larin,
  • A. N. Panibratets

摘要

Abstract

In the previous article (Part 1), the basic principles and international experience (according to CIGRE) of the development, calculation, and testing of the short-circuit resistance of large-scale models of powerful single-phase power transformers, as well as the rules for distributing test results of the model of a real transformer in order to confirm its resistance to short circuits, are considered. The importance of developing and testing such models to substantiate the reliability of domestically produced high-power transformers is noted. The article provides more detailed calculations of one of the 570-MVA transformer layouts described in the previous article. The results of the preliminary design of the two most commonly used transformers in the Russian Federation, with a capacity of 630 and 417 MVA, and their corresponding layouts based on calculations of resistance to short circuits using the REST-VEI method are also considered.