Scholarlink

Abstract <p>Reflection microscopy in the visible and near-infrared range is used to study optical properties of EuS<sub>2</sub> flakes. It is shown that for small flake areas, microreflection spectra can be adequately described by a model that combines the reflection of light from both the film‒substrate structure and the substrate. The indirect absorption edge (<i>E</i><sub><i>g</i></sub> = 0.83 eV) and the refractive index below the indirect absorption edge (<i>n</i> = 2.9) are determined from the microreflection spectra.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Optical Properties of the Layered Phase of EuS2 near the Indirect Absorption Edge

  • 期刊论文

  • 发表日期：

    2025年3月1日

查看全文
  • S. N. Nikolaev,
  • V. S. Krivobok,
  • I. I. Usmanov,
  • E. A. Ekimov

摘要

Abstract

Reflection microscopy in the visible and near-infrared range is used to study optical properties of EuS2 flakes. It is shown that for small flake areas, microreflection spectra can be adequately described by a model that combines the reflection of light from both the film‒substrate structure and the substrate. The indirect absorption edge (Eg = 0.83 eV) and the refractive index below the indirect absorption edge (n = 2.9) are determined from the microreflection spectra.