Surface Roughness and Lateral Forces on the Faces of Type Ib and IIa Diamond Single Crystals
摘要
This study presents the results of research on the roughness height parameters and lateral forces on the faces of cubes and octahedra of diamond single crystals and constructs maps of their distribution. The research was conducted using atomic force microscopy (AFM) and lateral force microscopy (LFM) using samples of type Ib and IIa diamond single crystals, grown using the high temperature and high pressure (HTHP) method. It was found that for type Ib diamond single crystals, the surface roughness (Ra parameter) of the cube faces is 3.3 times smaller, and that of the octahedron faces is 1.5 times smaller than for type IIa diamond single crystals. Additionally, for type Ib diamond single crystals, the lateral forces on the cube faces are, on average, 3.5 times smaller, while those on the octahedron faces are, on average, 9.5 times larger than for type IIa diamond single crystals. The results suggest that the level of lateral forces on the faces of diamond single crystals is determined by the roughness of their surfaces.