Scholarlink

Abstract <p>A method for estimating film thickness based on the color painting of the non-absorbing film-absorbing substrate system is proposed. The method can be useful for developing the technology of applying anti-reflective coatings to solar cells. The thickness of a dark blue anti-reflective SiO film applied to a silicon wafer was determined to illustrate the method.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Assessment of the Thickness of the Anti-Reflective Film of a Solar Cell by Color

  • 期刊论文

  • 发表日期：

    2025年4月1日

查看全文
  • V. G. Dyskin,
  • I. A. Yuldoshev,
  • U. B. Khamdamov

摘要

Abstract

A method for estimating film thickness based on the color painting of the non-absorbing film-absorbing substrate system is proposed. The method can be useful for developing the technology of applying anti-reflective coatings to solar cells. The thickness of a dark blue anti-reflective SiO film applied to a silicon wafer was determined to illustrate the method.