Scholarlink

<p>A scanning transmission electron microscopy (STEM)-based energy-dispersive X-ray spectroscopy (EDX) tomography method is developed for accurate three-dimensional (3-D) visualization of nanoscale composite microstructures. This approach overcomes the limitations of conventional STEM tomography for microstructures containing crystalline phases with minimal difference in atomic numbers. The STEM-EDX tomography method was utilized to generate reliable 3-D reconstructions of nano-fibrous silicon (average diameter ≈ 30&#xa0;nm) uniformly embedded in Aluminum matrix—a morphology previously ambiguous in two-dimensional microstructural characterization. Further validation has been done by local atom probe tomography reconstruction.</p> Graphical abstract <p></p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

A method for STEM tomography of nanocomposites with close-atomic number crystalline phases

  • 期刊论文

  • 出版模式：

    开放获取

  • 发表日期：

    2026年3月31日

查看全文
  • Arkajit Ghosh,
  • Tao Ma,
  • Allen Hunter,
  • Jian Wang,
  • Amit Misra

摘要

A scanning transmission electron microscopy (STEM)-based energy-dispersive X-ray spectroscopy (EDX) tomography method is developed for accurate three-dimensional (3-D) visualization of nanoscale composite microstructures. This approach overcomes the limitations of conventional STEM tomography for microstructures containing crystalline phases with minimal difference in atomic numbers. The STEM-EDX tomography method was utilized to generate reliable 3-D reconstructions of nano-fibrous silicon (average diameter ≈ 30 nm) uniformly embedded in Aluminum matrix—a morphology previously ambiguous in two-dimensional microstructural characterization. Further validation has been done by local atom probe tomography reconstruction.

Graphical abstract