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Abstract <p>Issues related to the determination of equivalent (averaged) values of the specific conductivity of films made of nanometer-thick materials under the influence of electromagnetic fields are considered. The significant roughness of the substrates with films does not allow us to compare their conductivity values with their thickness, so the main task is to obtain analytical expressions for the equivalent conductivity from the film thickness for various materials that can be used in modeling complex structures. To approximate the equivalent conductivity from the film thickness, a model of the diffraction of electromagnetic fields on a conductive nanoplane and known results of experimental studies for the coefficients of power reflection, transmission, and absorption (optical coefficients) are used.</p>

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Conductivity of Nanoscale Conductive Structures

  • 期刊论文

  • 发表日期：

    2025年6月1日

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  • V. V. Starostenko,
  • E. V. Grigoriev,
  • V. M. Vasilchenko,
  • E. P. Taran,
  • S. A. Zuev,
  • A. N. Kofanov,
  • S. A. Maksyuta

摘要

Abstract

Issues related to the determination of equivalent (averaged) values of the specific conductivity of films made of nanometer-thick materials under the influence of electromagnetic fields are considered. The significant roughness of the substrates with films does not allow us to compare their conductivity values with their thickness, so the main task is to obtain analytical expressions for the equivalent conductivity from the film thickness for various materials that can be used in modeling complex structures. To approximate the equivalent conductivity from the film thickness, a model of the diffraction of electromagnetic fields on a conductive nanoplane and known results of experimental studies for the coefficients of power reflection, transmission, and absorption (optical coefficients) are used.