Testing of “Hard” Four-Block X-Ray Interferometer with Laue Geometry of Diffraction
摘要
Abstract
A “hard” four-block Laue-case X-ray interferometer is proposed. The additional block, as compared to the three-block design, enables simultaneous generation of three interferograms from different parts of the interferometer. The rigidity of the interferometer structure ensures the absence of uncontrolled preliminary moiré (at least in the central interferogram), thereby improving measurements.