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Abstract <p>ZnO thin films are deposited onto indium tin oxide (ITO) glass substrates by sol‒gel coating at different preparation parameters: sol concentrations and annealing temperatures. The synthesized samples are characterized by ultraviolet—visible (UV-Vis) spectrophotometry, X-ray diffractometry, scanning electron microscopy, and energy-dispersive X-ray (EDX) spectroscopy. The results obtained show that the band gap energy decreases from 3.25 to 3.18 eV with an increase in the sol concentration and a similar decrease at higher annealing temperatures. X-ray diffraction patterns show a smaller full width at half maximum of the most intense (002) peak at higher sol concentrations and annealing temperatures. EDX analysis confirms the formation of high-purity ZnO thin films on ITO glass substrates.</p>

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Sol‒Gel Synthesis of Zinc Oxide Thin Films

  • 期刊论文

  • 发表日期：

    2025年4月24日

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  • M. A. Jafarov,
  • E. F. Nasirov,
  • S. A. Jahangirova

摘要

Abstract

ZnO thin films are deposited onto indium tin oxide (ITO) glass substrates by sol‒gel coating at different preparation parameters: sol concentrations and annealing temperatures. The synthesized samples are characterized by ultraviolet—visible (UV-Vis) spectrophotometry, X-ray diffractometry, scanning electron microscopy, and energy-dispersive X-ray (EDX) spectroscopy. The results obtained show that the band gap energy decreases from 3.25 to 3.18 eV with an increase in the sol concentration and a similar decrease at higher annealing temperatures. X-ray diffraction patterns show a smaller full width at half maximum of the most intense (002) peak at higher sol concentrations and annealing temperatures. EDX analysis confirms the formation of high-purity ZnO thin films on ITO glass substrates.