X-ray Diffraction and Analytical Electron Microscopy Study of Rhombohedral and Cubic phases in Pb-Bi-doped GeTe Alloy
摘要
Abstract
A study of GeTe doped with Pb and Bi (Ge0.86Pb0.1Bi0.04Te), used as a thermoelectric material, after heat treatment at 600 and 820 K demonstrates the potential and challenges of determining the chemical and phase composition of the matrix and precipitates using X-ray diffraction and analytical electron microscopy. The main phase is rhombohedral R3m GeTe (over 90 wt %); cubic GeTe (up to 5 wt %), cubic Ge (up to 2 wt %), and trace amounts of germanium oxide have been identified. The distribution of Pb and Bi impurities in the matrix crystal and secondary phase precipitates has been determined.