Scholarlink

Abstract <p>The results of structural studies using X-ray and electron microscopy diagnostics of NiO films obtained by magnetron sputtering have been analyzed. The difference in the phase and structural composition of films of different thicknesses before and after annealing is shown. The reasons for these differences are discussed, as well as the role of the interface layer formation for obtaining stable nanoscale NiO films on sapphire substrates.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Annealing-Induced Structural Transformation in NiO Thin Films

  • 期刊论文

  • 发表日期：

    2025年12月25日

查看全文
  • E. M. Pashaev,
  • A. P. Nosov,
  • I. A. Subbotin,
  • A. O. Belyaeva,
  • O. A. Kondratev,
  • S. G. Nikolaeva,
  • I. N. Trunkin,
  • A. L. Vasiliev

摘要

Abstract

The results of structural studies using X-ray and electron microscopy diagnostics of NiO films obtained by magnetron sputtering have been analyzed. The difference in the phase and structural composition of films of different thicknesses before and after annealing is shown. The reasons for these differences are discussed, as well as the role of the interface layer formation for obtaining stable nanoscale NiO films on sapphire substrates.