Abstract <p>The first results obtained by a new experimental method for phase-contrast microscopy of microobjects using synchrotron radiation and a nanofocusing lens in a cone-beam geometry are presented. In the experiment, a secondary radiation source is formed in the lens focus located at a small distance from the microobject, enabling the acquisition of its magnified image. Under the near-field regime, the microobject structure can relatively easily be determined from the experimental image using the transport of intensity equation. The experiment was performed at the KISI-Kurchatov synchrotron radiation source. A model weakly absorbing microobject—commercially available carbon fiber of grade VMN-4—was used. The&#xa0;obtained fiber dimensions and structural features, resolved with submicron spatial resolution, are consistent with the electron microscopy data.</p>

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A New Method of Phase-Contrast Microscopy of Microobjects Using a Nanofocusing Lens in Synchrotron Radiation

  • M. S. Folomeshkin,
  • V. G. Kohn,
  • A. Yu. Seregin,
  • Yu. A. Volkovsky,
  • A. V. Aleksandrov,
  • P. A. Prosekov,
  • V. A. Yunkin,
  • A. A. Snigirev,
  • Yu. V. Pisarevsky,
  • A. E. Blagov,
  • M. V. Kovalchuk

摘要

Abstract

The first results obtained by a new experimental method for phase-contrast microscopy of microobjects using synchrotron radiation and a nanofocusing lens in a cone-beam geometry are presented. In the experiment, a secondary radiation source is formed in the lens focus located at a small distance from the microobject, enabling the acquisition of its magnified image. Under the near-field regime, the microobject structure can relatively easily be determined from the experimental image using the transport of intensity equation. The experiment was performed at the KISI-Kurchatov synchrotron radiation source. A model weakly absorbing microobject—commercially available carbon fiber of grade VMN-4—was used. The obtained fiber dimensions and structural features, resolved with submicron spatial resolution, are consistent with the electron microscopy data.