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Abstract <p>We studies a proximity effect in 7.5-to-100-nm-thick NbN films with 5-nm-thick layer of Mo deposited in situ. This effect is revealed by 1–2 K decrease of critical temperature and increase of the ratio of critical current to depairing current up to 0.78. The latter effect is prospective for micrometer-wide superconducting single-photon detectors.</p>

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Approaching the Depairing Current in Two-Layer NbN–Mo Structures

  • 期刊论文

  • 发表日期：

    2026年5月1日

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  • M. A. Dryazgov,
  • Yu. P. Korneeva,
  • N. V. Porokhov,
  • M. Yu. Levichev,
  • N. N. Osipov,
  • D. Yu. Vodolazov,
  • A. A. Korneev,
  • M. A. Tarkhov

摘要

Abstract

We studies a proximity effect in 7.5-to-100-nm-thick NbN films with 5-nm-thick layer of Mo deposited in situ. This effect is revealed by 1–2 K decrease of critical temperature and increase of the ratio of critical current to depairing current up to 0.78. The latter effect is prospective for micrometer-wide superconducting single-photon detectors.