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Abstract <p>The contact melting of the Cu–Ag bimetallic nanolayer is simulated using full-atom molecular dynamics. The resulting system is of the eutectic type. Fractal analysis is used to control the change of its internal state. The fractal dimension is evaluated using the box-counting method. The analysis of the evolution of the fractal dimension of the nanolayer thickness partition sections over time shows that this characteristic well reflects the evolution of the main structural motifs of the studied system.</p>

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Application of Fractal Analysis to Characterize the Contact Melting Process in a Bimetallic Cu–Ag Nanolayer

  • 期刊论文

  • 发表日期：

    2025年6月1日

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  • V. M. Samsonov,
  • N. B. Kuzmin,
  • I. V. Talyzin,
  • N. Yu. Sdobnyakov,
  • P. M. Pakhomov,
  • P. V. Komarov

摘要

Abstract

The contact melting of the Cu–Ag bimetallic nanolayer is simulated using full-atom molecular dynamics. The resulting system is of the eutectic type. Fractal analysis is used to control the change of its internal state. The fractal dimension is evaluated using the box-counting method. The analysis of the evolution of the fractal dimension of the nanolayer thickness partition sections over time shows that this characteristic well reflects the evolution of the main structural motifs of the studied system.