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<p>The structure of interfacial boundaries in a liquid crystal cell, composed of sequential layers of a thin-film electrode, an alignment polymer coating, and a ferroelectric liquid crystal, was investigated using X-ray scattering and atomic force microscopy. Quantitative parameters describing the structure of transition layers were obtained, along with statistical data on interface roughness and dielectric constant distribution across the film. These data are expected to provide a link between the roughness and anchoring properties of liquid crystal materials at interfaces and give an assessment of the structural modifications occurring at each stage of the electro-optical cell assembly.</p>

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Structure of the Hidden Interfaces in Liquid Crystal Electro-Optical Cell Studied by X-Ray Scattering and Atomic Force Microscopy

  • 期刊论文

  • 发表日期：

    2025年9月29日

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  • Y. O. Volkov,
  • B. S. Roshchin,
  • A. D. Nuzhdin,
  • A. A. Zhukovich-Gordeeva,
  • E. P. Pozhidaev,
  • R. V. Gainutdinov,
  • V. E. Asadchikov,
  • B. I. Ostrovskii

摘要

The structure of interfacial boundaries in a liquid crystal cell, composed of sequential layers of a thin-film electrode, an alignment polymer coating, and a ferroelectric liquid crystal, was investigated using X-ray scattering and atomic force microscopy. Quantitative parameters describing the structure of transition layers were obtained, along with statistical data on interface roughness and dielectric constant distribution across the film. These data are expected to provide a link between the roughness and anchoring properties of liquid crystal materials at interfaces and give an assessment of the structural modifications occurring at each stage of the electro-optical cell assembly.