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<p>Switchgear manufacturers and type testing laboratories conduct the active load-current switching test of MV interrupter switches (load break switch or disconnector) following the guidelines of either the IEEE or IEC standards. However, the testing guidelines defined by these two standards to calculate the test circuit parameters are different; therefore, the dielectric and thermal stress applied by the transient recovery voltage (TRV) in IEEE and IEC tests are different. This paper investigated the TRV of load switching tests to find out which standard among IEEE and IEC is stricter. Simulations were done in PSCAD for 15, 27 and 38&#xa0;kV 100 and 800&#xa0;A load break switch, and a four-parameter TRV envelope was used to characterize the TRV. The impact of load power factor on the shape of the test TRV was examined for both standards. To establish the acceptance of the simulated results, the calculated rate-of-rise of TRV (RRTRV) from simulations were compared with Jonsson’s experiments in early 2010s, and the critical RRTRV vs. rate-of-fall of current characteristics were compared with Birtwhistle’s experiment of the early 1970s. It was found that the IEC test TRV applies higher dielectric and thermal stress than IEEE test TRV on an interrupter for any voltage, current and load power factor.</p>

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Transient recovery voltage for load current switching test of MV load break switch

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2026年8月1日

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  • Asif Islam

摘要

Switchgear manufacturers and type testing laboratories conduct the active load-current switching test of MV interrupter switches (load break switch or disconnector) following the guidelines of either the IEEE or IEC standards. However, the testing guidelines defined by these two standards to calculate the test circuit parameters are different; therefore, the dielectric and thermal stress applied by the transient recovery voltage (TRV) in IEEE and IEC tests are different. This paper investigated the TRV of load switching tests to find out which standard among IEEE and IEC is stricter. Simulations were done in PSCAD for 15, 27 and 38 kV 100 and 800 A load break switch, and a four-parameter TRV envelope was used to characterize the TRV. The impact of load power factor on the shape of the test TRV was examined for both standards. To establish the acceptance of the simulated results, the calculated rate-of-rise of TRV (RRTRV) from simulations were compared with Jonsson’s experiments in early 2010s, and the critical RRTRV vs. rate-of-fall of current characteristics were compared with Birtwhistle’s experiment of the early 1970s. It was found that the IEC test TRV applies higher dielectric and thermal stress than IEEE test TRV on an interrupter for any voltage, current and load power factor.