Scholarlink

<p>Light beams carrying Orbital Angular Momentum (OAM) are of broad interest in fundamental optics and have important applications in communication, sensing, and metrology. Conventional techniques require capturing full-beam spot with large optics, restricting scalability and integration. In this work, we demonstrate that both the order and sign of OAM modes can be identified by sampling only a small part of the beam. Reliable mode discrimination was achieved using only <InlineEquation ID="IEq1"> <EquationSource Format="TEX">\(15{-}20 \%\)</EquationSource> </InlineEquation> of the beam cross-section. Experiments with <InlineEquation ID="IEq2"> <EquationSource Format="TEX">\(l=\pm 2\)</EquationSource> </InlineEquation> agreed with analytical predictions within <InlineEquation ID="IEq3"> <EquationSource Format="TEX">\(1{-}10 \%\)</EquationSource> </InlineEquation> error, and simulations up to <InlineEquation ID="IEq4"> <EquationSource Format="TEX">\(|l|\le 10\)</EquationSource> </InlineEquation> confirmed systematic order-dependent shifts. This localized sampling approach provides a hardware-efficient and scalable pathway for OAM detection in optical communication, metrology, and integrated photonics.</p>

错误：搜索内容不能为空，请输入英文关键词
错误：关键词超出字数限制，请精简
高级检索

Analyzing Orbital Angular Momentum (OAM) mode via localized beam sampling

  • 期刊论文

  • 出版模式：

    开放获取

  • 发表日期：

    2026年4月25日

查看全文
  • Ayush Mehra,
  • Shlomi Arnon

摘要

Light beams carrying Orbital Angular Momentum (OAM) are of broad interest in fundamental optics and have important applications in communication, sensing, and metrology. Conventional techniques require capturing full-beam spot with large optics, restricting scalability and integration. In this work, we demonstrate that both the order and sign of OAM modes can be identified by sampling only a small part of the beam. Reliable mode discrimination was achieved using only \(15{-}20 \%\) of the beam cross-section. Experiments with \(l=\pm 2\) agreed with analytical predictions within \(1{-}10 \%\) error, and simulations up to \(|l|\le 10\) confirmed systematic order-dependent shifts. This localized sampling approach provides a hardware-efficient and scalable pathway for OAM detection in optical communication, metrology, and integrated photonics.