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<p>Antiferromagnetic (AFM) materials are promising for next-generation spintronic applications, however, practical implementation remains challenging due to difficulties in controlling the Néel order and the lack of sensitive, device-compatible readout techniques. In this work, we demonstrate spin Hall magnetoresistance (SHMR) as an effective and versatile approach for probing Néel order, even in polycrystalline AFM films. Using NiO/Pt and LaNiO<sub>3</sub>/Pt bilayers as model systems, we show that SHMR measurements can detect the Néel temperature (T<sub>N</sub>), monitor spin-flop transition, and reveal field-induced orientation of the Néel order. Crucially, we establish that the control of Néel order with non-volatility is effective when initiated from the “soft” AFM phase at elevated temperature (380&#xa0;K) via field-cooling (FC), enabling robust alignment of Néel order without the need for adjacent heavy metals as spin current sources. This spin-current-free control greatly expands the flexibility and scalability of AFM device design, especially in the form of polycrystalline microstructure. The results highlight the combined FC and SHMR technique as a powerful and flexible platform for both manipulation and sensitive readout of AFM states, providing a reliable basis for the design and characterization of a broad class of AFM materials and devices.</p>

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Effective control and probe of Néel order in polycrystalline NiO films: a combined approach to study antiferromagnets

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2026年1月23日

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  • Chun-Chieh Hsu,
  • Yu-Chen Lin,
  • I-Yu Cheng,
  • Shuan-Cheng Mai,
  • Danru Qu,
  • Alexander J. Grutter,
  • Margaret Kane,
  • Yuri Suzuki,
  • Yu-Lon Lin,
  • Chao-Yao Yang

摘要

Antiferromagnetic (AFM) materials are promising for next-generation spintronic applications, however, practical implementation remains challenging due to difficulties in controlling the Néel order and the lack of sensitive, device-compatible readout techniques. In this work, we demonstrate spin Hall magnetoresistance (SHMR) as an effective and versatile approach for probing Néel order, even in polycrystalline AFM films. Using NiO/Pt and LaNiO3/Pt bilayers as model systems, we show that SHMR measurements can detect the Néel temperature (TN), monitor spin-flop transition, and reveal field-induced orientation of the Néel order. Crucially, we establish that the control of Néel order with non-volatility is effective when initiated from the “soft” AFM phase at elevated temperature (380 K) via field-cooling (FC), enabling robust alignment of Néel order without the need for adjacent heavy metals as spin current sources. This spin-current-free control greatly expands the flexibility and scalability of AFM device design, especially in the form of polycrystalline microstructure. The results highlight the combined FC and SHMR technique as a powerful and flexible platform for both manipulation and sensitive readout of AFM states, providing a reliable basis for the design and characterization of a broad class of AFM materials and devices.