Integrated anti-electronics for positron annihilation spectroscopy
摘要
Imaging the features of a sample using Positron Annihilation Spectroscopy (PAS) is currently achieved by rastering, i.e. by scanning the sample surface with a sharply focused positron beam. However, a beam of arbitrary shape (sculpted beam) would allow the application of more versatile single-pixel imaging (SPI) techniques. I introduce the design of a microelectronic device employing a 2D array of Zener diodes as an active positron moderator, capable of sculpting positron beams with