<p>Exit wavefunction reconstruction is important in transmission electron microscopy for structural studies. We describe electron Fourier ptychography and its application to phase reconstruction of both radiation-resistant and beam-sensitive materials. We demonstrate that the phase of the exit wave can be reconstructed to high resolution using a modified iterative phase retrieval algorithm from data collected in an alternative optical geometry. This method achieves a spatial resolution of 0.63&#xa0;nm at a fluence of 4.5 × 10<sup>2</sup> e<sup>−</sup>/nm<sup>2</sup>, as validated on Cry11Aa protein crystals under cryogenic conditions. Notably, this method requires no instrumental modifications, is straightforward to implement, and can be seamlessly integrated with existing data collection software, providing a broadly accessible alternative approach for structural studies.</p>

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Electron fourier ptychography for phase reconstruction

  • Jingjing Zhao,
  • Chen Huang,
  • Ali Mostaed,
  • Amirafshar Moshtaghpour,
  • James M. Parkhurst,
  • Ivan Lobato,
  • Marcus Gallagher-Jones,
  • Judy S. Kim,
  • Mark Boyce,
  • David Stuart,
  • Elena A. Andreeva,
  • Jacques-Philippe Colletier,
  • Angus I. Kirkland

摘要

Exit wavefunction reconstruction is important in transmission electron microscopy for structural studies. We describe electron Fourier ptychography and its application to phase reconstruction of both radiation-resistant and beam-sensitive materials. We demonstrate that the phase of the exit wave can be reconstructed to high resolution using a modified iterative phase retrieval algorithm from data collected in an alternative optical geometry. This method achieves a spatial resolution of 0.63 nm at a fluence of 4.5 × 102 e/nm2, as validated on Cry11Aa protein crystals under cryogenic conditions. Notably, this method requires no instrumental modifications, is straightforward to implement, and can be seamlessly integrated with existing data collection software, providing a broadly accessible alternative approach for structural studies.