The following paper presents the results of a study carried on the impact of null-filling on measurement distances in circular Taylor patterns. Achieving the desired ripple control over these patterns requires the introduction of M complex roots, resulting in \(2^{M}\) distinct continuous aperture distributions, each corresponding to a potentially different measurement distance requirement. However, this null-filling process is associated with efficiency losses and complex distribution. To evaluate these effects, we compared the optimal -25 dB SLL distribution with \(\overline{n}\) =5, known to offer maximal efficiency, to the same sidelobe level and optimal transition integer, but affected by null-filling. Additionally, we analyzed the influence of null-filling on the \(\overline{n}\) =5, -25 dB SLL pattern with the first sidelobe depressed at -40 dB, by controlling the ripple surrounding the depressed lobe and the next four sidelobes, as well as by maintaining deep nulls around the depressed lobe, while managing the ripple of the remaining four.
