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<p>We report on the potential application of crystalline thin metal oxide films (TiO<sub>x</sub>, SnO<sub>x</sub>) with varying stoichiometries in perovskite solar cell devices. The oxides were deposited via reactive e-beam evaporation, involving the sublimation of pure metals under different pressures of pure oxygen, followed by thermal annealing at 200&#xa0;°C. Variable angle spectroscopic ellipsometry, X-ray diffraction (XRD), contact angle measurements, scanning electron microscopy (SEM), and energy-dispersive X-ray spectroscopy (EDS) were used to characterize the films. XRD findings confirmed the crystalline phases of SnOx thin films treated at 200&#xa0;°C for the most oxygen-rich films (deposited at 2e-4&#xa0;Torr), while TiOx layers exhibited an amorphous phase. FESEM results confirmed that uniform and dense films were generated across the entire substrate surface. Using the measured refractive indices in a computational model, it was demonstrated that optimizing the device design with these films could result in power conversion efficiencies surpassing 25%.</p>

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Enhanced perovskite solar cells performance with TiOx and SnOx thin films as electron transport layers

  • 期刊论文

  • 出版模式：

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  • 发表日期：

    2025年3月5日

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  • Mohammad Istiaque Hossain,
  • Puvaneswaran Chelvanathan,
  • Brahim Aissa,
  • Amith Khandakar,
  • Ahasanur Rahman,
  • Said Mansour

摘要

We report on the potential application of crystalline thin metal oxide films (TiOx, SnOx) with varying stoichiometries in perovskite solar cell devices. The oxides were deposited via reactive e-beam evaporation, involving the sublimation of pure metals under different pressures of pure oxygen, followed by thermal annealing at 200 °C. Variable angle spectroscopic ellipsometry, X-ray diffraction (XRD), contact angle measurements, scanning electron microscopy (SEM), and energy-dispersive X-ray spectroscopy (EDS) were used to characterize the films. XRD findings confirmed the crystalline phases of SnOx thin films treated at 200 °C for the most oxygen-rich films (deposited at 2e-4 Torr), while TiOx layers exhibited an amorphous phase. FESEM results confirmed that uniform and dense films were generated across the entire substrate surface. Using the measured refractive indices in a computational model, it was demonstrated that optimizing the device design with these films could result in power conversion efficiencies surpassing 25%.