<p>Organic molecular crystals encompass a vast range of materials from pharmaceuticals to organic optoelectronics, proteins and waxes in biological and industrial settings. Crystal defects from grain boundaries to dislocations are known to play key roles in mechanisms of growth<sup><CitationRef CitationID="CR1">1</CitationRef>,<CitationRef CitationID="CR2">2</CitationRef></sup> and in the functional properties of molecular crystals<sup><CitationRef AdditionalCitationIDS="CR4" CitationID="CR3">3</CitationRef>–<CitationRef CitationID="CR5">5</CitationRef></sup>. In contrast to the precise analysis of individual defects in metals, ceramics and inorganic semiconductors enabled by electron microscopy, substantially greater ambiguity remains in the experimental determination of individual dislocation character and slip systems in molecular materials<sup><CitationRef CitationID="CR3">3</CitationRef></sup>. In large part, nanoscale dislocation analysis in molecular crystals has been hindered by the low electron doses required to avoid irreversibly degrading these crystals<sup><CitationRef CitationID="CR6">6</CitationRef></sup>. Here we present a low-dose, single-exposure approach enabling nanometre-resolved analysis of individual dislocations in molecular crystals. We demonstrate the approach for a range of crystal types to reveal dislocation character and operative slip systems unambiguously.</p>

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Microscopic crystallographic analysis of dislocations in molecular crystals

  • Sang T. Pham,
  • Natalia Koniuch,
  • Emily Wynne,
  • Andy Brown,
  • Sean M. Collins

摘要

Organic molecular crystals encompass a vast range of materials from pharmaceuticals to organic optoelectronics, proteins and waxes in biological and industrial settings. Crystal defects from grain boundaries to dislocations are known to play key roles in mechanisms of growth1,2 and in the functional properties of molecular crystals35. In contrast to the precise analysis of individual defects in metals, ceramics and inorganic semiconductors enabled by electron microscopy, substantially greater ambiguity remains in the experimental determination of individual dislocation character and slip systems in molecular materials3. In large part, nanoscale dislocation analysis in molecular crystals has been hindered by the low electron doses required to avoid irreversibly degrading these crystals6. Here we present a low-dose, single-exposure approach enabling nanometre-resolved analysis of individual dislocations in molecular crystals. We demonstrate the approach for a range of crystal types to reveal dislocation character and operative slip systems unambiguously.