<p>The small dimensions of microfabricated devices present challenges in applications such as inertial sensing, where a larger proofmass is necessary for enhanced sensitivity. An effective approach to addressing the limitations of linear sensing is to use nonlinear mechanisms that adapt the device’s response according to different operating conditions. This paper introduces a new nonlinear spring mechanism for use in microsensors that harnesses the buckling phenomenon to achieve stiffness softening. The proposed mechanism utilizes a micro-arm to apply an eccentric axial load to an inclined beam, causing it to buckle in a controlled manner under a specified load. Once buckled, linear springs dominate the response of the system. We demonstrate that this method results in a smaller bias displacement compared to previously reported techniques based on snap-through behaviour, leading to potential reductions in device size and improvements in operational range. The behaviour is analytically modelled and verified through simulations. A prototype device was designed and microfabricated to experimentally validate the design principles. Compared to pre-curved nonlinear springs, the proposed design results in an 11-fold reduction in bias force, a 100-fold reduction in bias displacement, and a reduction in mechanical stiffness by a factor of 520. These results were verified through experiments conducted on a microfabricated accelerometer with an on-chip optical interferometer. Test results reveal an extended linear range of better than <InlineEquation ID="IEq1"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="41378_2025_1066_Article_IEq1.gif" Format="GIF" Height="16" Rendition="HTML" Resolution="72" Type="Linedraw" Width="49" /> </InlineMediaObject> <EquationSource Format="TEX">\(150\,\mathrm{mg}\)</EquationSource> <EquationSource Format="MATHML"><math> <mrow> <mn>150</mn> <mspace width="0.25em" /> <mi>mg</mi> </mrow> </math></EquationSource> </InlineEquation>, a bias force of 0.3 <InlineEquation ID="IEq2"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="41378_2025_1066_Article_IEq2.gif" Format="GIF" Height="14" Rendition="HTML" Resolution="72" Type="Linedraw" Width="27" /> </InlineMediaObject> <EquationSource Format="TEX">\(\mathrm{mN}\)</EquationSource> <EquationSource Format="MATHML"><math> <mi>mN</mi> </math></EquationSource> </InlineEquation>, and a bias displacement of 10 <InlineEquation ID="IEq3"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="41378_2025_1066_Article_IEq3.gif" Format="GIF" Height="12" Rendition="HTML" Resolution="72" Type="Linedraw" Width="26" /> </InlineMediaObject> <EquationSource Format="TEX">\(\mathrm{\mu m}\)</EquationSource> <EquationSource Format="MATHML"><math> <mi>μm</mi> </math></EquationSource> </InlineEquation>, measured with an integrated optical interferometer with a displacement noise floor of 40 <InlineEquation ID="IEq4"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="41378_2025_1066_Article_IEq4.gif" Format="GIF" Height="21" Rendition="HTML" Resolution="72" Type="Linedraw" Width="66" /> </InlineMediaObject> <EquationSource Format="TEX">\(\mathrm{pm}/\sqrt{\mathrm{Hz}}\)</EquationSource> <EquationSource Format="MATHML"><math> <mrow> <mi>pm</mi> <mo>/</mo> <msqrt> <mi>Hz</mi> </msqrt> </mrow> </math></EquationSource> </InlineEquation> at 2 <InlineEquation ID="IEq5"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="41378_2025_1066_Article_IEq5.gif" Format="GIF" Height="14" Rendition="HTML" Resolution="72" Type="Linedraw" Width="21" /> </InlineMediaObject> <EquationSource Format="TEX">\(\mathrm{Hz}\)</EquationSource> <EquationSource Format="MATHML"><math> <mi>Hz</mi> </math></EquationSource> </InlineEquation> and sensitivity of <InlineEquation ID="IEq6"> <InlineMediaObject> <ImageObject Color="BlackWhite" FileRef="41378_2025_1066_Article_IEq6.gif" Format="GIF" Height="19" Rendition="HTML" Resolution="72" Type="Linedraw" Width="62" /> </InlineMediaObject> <EquationSource Format="TEX">\({194}^{\circ }/\mathrm{mg}\)</EquationSource> <EquationSource Format="MATHML"><math> <mrow> <msup> <mrow> <mn>194</mn> </mrow> <mo>∘</mo> </msup> <mo>/</mo> <mi>mg</mi> </mrow> </math></EquationSource> </InlineEquation>.</p><p></p>

错误:搜索内容不能为空,请输入英文关键词
错误:关键词超出字数限制,请精简
高级检索

A nonlinear stiffness softening mechanism for low-bias, high-sensitivity MEMS accelerometers with extended dynamic range

  • Peyman Firoozy,
  • Milad Seifnejad Haghighi,
  • Mikhail Kanygin,
  • Philip Ferguson,
  • Behraad Bahreyni

摘要

The small dimensions of microfabricated devices present challenges in applications such as inertial sensing, where a larger proofmass is necessary for enhanced sensitivity. An effective approach to addressing the limitations of linear sensing is to use nonlinear mechanisms that adapt the device’s response according to different operating conditions. This paper introduces a new nonlinear spring mechanism for use in microsensors that harnesses the buckling phenomenon to achieve stiffness softening. The proposed mechanism utilizes a micro-arm to apply an eccentric axial load to an inclined beam, causing it to buckle in a controlled manner under a specified load. Once buckled, linear springs dominate the response of the system. We demonstrate that this method results in a smaller bias displacement compared to previously reported techniques based on snap-through behaviour, leading to potential reductions in device size and improvements in operational range. The behaviour is analytically modelled and verified through simulations. A prototype device was designed and microfabricated to experimentally validate the design principles. Compared to pre-curved nonlinear springs, the proposed design results in an 11-fold reduction in bias force, a 100-fold reduction in bias displacement, and a reduction in mechanical stiffness by a factor of 520. These results were verified through experiments conducted on a microfabricated accelerometer with an on-chip optical interferometer. Test results reveal an extended linear range of better than \(150\,\mathrm{mg}\) 150 mg , a bias force of 0.3 \(\mathrm{mN}\) mN , and a bias displacement of 10 \(\mathrm{\mu m}\) μm , measured with an integrated optical interferometer with a displacement noise floor of 40 \(\mathrm{pm}/\sqrt{\mathrm{Hz}}\) pm / Hz at 2 \(\mathrm{Hz}\) Hz and sensitivity of \({194}^{\circ }/\mathrm{mg}\) 194 / mg .