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<p>The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.</p>

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Random Illumination Microscopy: faster, thicker, and aberration-insensitive

  • 期刊论文

  • 出版模式：

    开放获取

  • 发表日期：

    2025年1月2日

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  • Boya Jin,
  • Peng Xi

摘要

The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.